LuValle, Michael J./LeFevre, Bruce G./Kannan, SirRaman: Design and Analysis of Accelerated Tests for Mission Critical Reliability. 1st ed. Chapman and Hall/CRC, 2004. 16 x 24 cm. 248 pages. HC Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped.

• Category: Varia
• Keywords: HELF
• Language: English (en)
• ISBN: 9781584884712
• Order Number: 9761VB

Our Price: EUR 24,--