Bai, Scanning Tunneling Microscopy and Its Application.
Bai, Scanning Tunneling Microscopy and Its Application.
Bai, C.: Scanning Tunneling Microscopy and Its Application. Berlin, Springer, 1995. 181 figs., XII, 331 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped/gestempelt. Springer Series in Surface Sciences, vol. 32
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