Antiquariat im Hufelandhaus GmbH vorm. Lange & Springer Hegelplatz 1, 10117 Berlin

Wang, Testing of Interposer-Based 2.5D Integrated Circuits.

Wang, Testing of Interposer-Based 2.5D Integrated Circuits.

Wang, Ran; Chakrabarty, Krishnendu: Testing of Interposer-Based 2.5D Integrated Circuits. Cham, Springer, 2017. XIV, 182 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped.

  • Category: Technik
  • Keywords: Elektrotechnik
  • Language: English (en)
  • ISBN: 9783319547138
  • Order Number: 8077GB

Our Price: EUR 14,-- 


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