Wang, Zheng; Chattopadhyay, Anupam: High-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip. Singapore, Springer, 2018. XX, 197 p. Softcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Computer Architecture and Design Methodologies.

• Kategorie: Technik
• Schlagwörter: Elektrotechnik
• Sprache: Englisch (en)
• ISBN: 9789811093210
• Bestellnummer: 9099GB

Unser Preis: EUR 12,--