Ventura, Sebastian; Luna, José María: Supervised Descriptive Pattern Mining. Cham, Springer, 2018. XI, 185 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped.

• Category: Informatik
• Language: English (en)
• ISBN: 9783319981390
• Order Number: 11959DB

Our Price: EUR 14,--