Tan, Applications of Finite Element Methods for Reliability Studies on ULSI Inte…
Tan, Applications of Finite Element Methods for Reliability Studies on ULSI Inte
Tan, Cher Ming; Wei Li; Zhengao Gan; Yuejin Hou: Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections. London, Springer, 2011. VII, 150 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Springer Series in Reliability Engineering.
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