Nakamura, Takashi/Ibe, Eishi/Baba, Mamoru/Yahagi, Yasuo/Kameyama, Hideaki: Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices. World Scientific Publishing Company, 2008. 15 x 23 cm. 368 pages. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped.

• Category: Varia
• Keywords: HELF
• Language: English (en)
• ISBN: 9789812778819
• Order Number: 6196VB

Our Price: EUR 21,--